Nicolici, Nicola: шукати на сайті Z-Library

Рік:

2010

Мова:

english

Файл:

PDF, 576 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Low-Power Test Pattern Generation

Рік:

2010

Мова:

english

Файл:

PDF, 2.18 MB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices ||

Taatizadeh, Pouya, Nicolici, Nicola

Рік:

2010

Мова:

english

Файл:

PDF, 257 KB

english, 2010

[IEEE 2009 IEEE Custom Integrated Circuits Conference (CICC) - San Jose, CA, USA (2009.09.13-2009.09.16)] 2009 IEEE Custom Integrated Circuits Conference - A 1.5GS/s 4096-point digital spectrum analyzer for space-borne applications

Richards, Brian, Nicolici, Nicola, Chen, Henry, Chao, Kevin, Abiad, Robert, Werthimer, Dan, Nikolic, Borivoje

Рік:

2009

Мова:

english

Файл:

PDF, 1.33 MB

english, 2009

Emulation Infrastructure for the Evaluation of Hardware Assertions for Post-silicon Validation

Журнал:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Рік:

2017

Мова:

english

Файл:

PDF, 2.87 MB

english, 2017

Scan Division Algorithm for Shift and Capture Power Reduction for At-Speed Test Using Skewed-Load Test Application Strategy

Ho Fai Ko, Nicola Nicolici

Журнал:

Journal of Electronic Testing

Рік:

2008

Мова:

english

Файл:

PDF, 460 KB

english, 2008

Guest Editorial

Nicola Nicolici, Patrick Girard

Журнал:

Journal of Electronic Testing

Рік:

2008

Мова:

english

Файл:

PDF, 42 KB

english, 2008

Testability Trade-Offs for BIST Data Paths

Nicola Nicolici, Bashir M. Al-Hashimi

Журнал:

Journal of Electronic Testing

Рік:

2004

Мова:

english

Файл:

PDF, 257 KB

english, 2004

Guest Editors' Introduction: Surveying the Landscape of FPGA Accelerator Research

Constantinides, George, Nicolici, Nicola

Журнал:

IEEE Design & Test of Computers

Рік:

2011

Мова:

english

Файл:

PDF, 67 KB

english, 2011

Power-Aware Testing and Test Strategies for Low Power Devices || Fundamentals of VLSI Testing

Рік:

2010

Мова:

english

Файл:

PDF, 819 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices Volume 466 || || Front_matter

Рік:

2010

Мова:

english

Файл:

PDF, 257 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Power-Aware Test Data Compression and BIST

Рік:

2010

Мова:

english

Файл:

PDF, 1.12 MB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Test Strategies for Gated Clock Designs

Рік:

2010

Мова:

english

Файл:

PDF, 676 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Test of Power Management Structures

Рік:

2010

Мова:

english

Файл:

PDF, 839 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Power-Aware Design-for-Test

Рік:

2010

Мова:

english

Файл:

PDF, 2.27 MB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Power Issues During Test

Рік:

2010

Мова:

english

Файл:

PDF, 975 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Power-Aware System-Level Test Planning

Рік:

2010

Мова:

english

Файл:

PDF, 1.08 MB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Low-Power Design Techniques and Test Implications

Рік:

2010

Мова:

english

Файл:

PDF, 872 KB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || Test Strategies for Multivoltage Designs

Рік:

2010

Мова:

english

Файл:

PDF, 1.16 MB

english, 2010

Power-Aware Testing and Test Strategies for Low Power Devices || EDA Solution for Power-Aware Design-for-Test

Рік:

2010

Мова:

english

Файл:

PDF, 1.24 MB

english, 2010

On Using On-Chip Clock Tuning Elements to Address Delay Degradation Due to Circuit Aging

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 6.75 MB

english, 2012

NoC-Based FPGA Acceleration for Monte Carlo Simulations with Applications to SPECT Imaging

Kinsman, Phillip J., Nicolici, Nicola

Журнал:

IEEE Transactions on Computers

Рік:

2013

Мова:

english

Файл:

PDF, 1.57 MB

english, 2013

[IEEE 2007 IEEE International Test Conference - Santa Clara, CA, USA (2007.10.21-2007.10.26)] 2007 IEEE International Test Conference - On using lossless compression of debug data in embedded logic analysis

Anis, Ehab, Nicolici, Nicola

Рік:

2007

Мова:

english

Файл:

PDF, 219 KB

english, 2007

[ACM Press the 18th annual ACM/SIGDA international symposium - Monterey, California, USA (2010.02.21-2010.02.23)] Proceedings of the 18th annual ACM/SIGDA international symposium on Field programmable gate arrays - FPGA '10 - Haptic rendering of deformable objects using a multiple FPGA parallel computing architecture

Mahdavikhah, Behzad, Mafi, Ramin, Sirouspour, Shahin, Nicolici, Nicola

Рік:

2010

Мова:

english

Файл:

PDF, 1.73 MB

english, 2010

[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - A New Algorithm for Post-Silicon Clock Measurement and Tuning

Gizopoulos, Dimitris, Roy, Kaushik, Girard, Patrick, Nicolici, Nicola, Wen, Xiaoqing

Рік:

2011

Мова:

english

Файл:

PDF, 205 KB

english, 2011

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Power-Aware Testing and Test Strategies for Low Power Devices

Рік:

2008

Мова:

english

Файл:

PDF, 80 KB

english, 2008

Mapping Trigger Conditions onto Trigger Units during Post-silicon Validation and Debugging

IEEE Transactions on Computers

Журнал:

Рік:

2012

Мова:

english

Файл:

PDF, 1.76 MB

english, 2012

A Novel Algorithmic Approach to Aid Post-Silicon Delay Measurement and Clock Tuning

IEEE Transactions on Computers

Журнал:

Рік:

2014

Мова:

english

Файл:

PDF, 1.44 MB

english, 2014

[IEEE Design, Automation & Test in Europe Conference - Nice, France (2007.04.16-2007.04.20)] 2007 Design, Automation & Test in Europe Conference & Exhibition - Low Cost Debug Architecture using Lossy Compression for Silicon Debug

Anis, Ehab, Nicolici, Nicola

Рік:

2007

Мова:

english

Файл:

PDF, 201 KB

english, 2007

[IEEE 2008 13th IEEE European Test Symposium (ETS) - Verbania, italy (2008.05.25-2008.05.29)] 2008 13th European Test Symposium - On Bypassing Blocking Bugs during Post-Silicon Validation

Daoud, Ehab Anis, Nicolici, Nicola

Рік:

2008

Мова:

english

Файл:

PDF, 248 KB

english, 2008

[IEEE 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2011.11.7-2011.11.10)] 2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - In-system and on-the-fly clock tuning mechanism to combat lifetime performance degradation

Kinsman, Adam B., Nicolici, Nicola

Рік:

2011

Мова:

english

Файл:

PDF, 535 KB

english, 2011

[IEEE 2009 IEEE International Conference on Computer Design (ICCD 2009) - Lake Tahoe, CA, USA (2009.10.4-2009.10.7)] 2009 IEEE International Conference on Computer Design - Computational bit-width allocation for operations in vector calculus

Рік:

2009

Мова:

english

Файл:

PDF, 524 KB

english, 2009

[IEEE 2009 IEEE International High Level Design Validation and Test Workshop (HLDVT) - San Francisco, CA, USA (2009.11.4-2009.11.6)] 2009 IEEE International High Level Design Validation and Test Workshop - Design-for-debug for post-silicon validation: Can high-level descriptions help?

Nicolici, Nicola, Ko, Ho Fai

Рік:

2009

Мова:

english

Файл:

PDF, 479 KB

english, 2009

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Embedded Tutorial on Low Power Test

Nicolici, Nicola, Wen, Xiaoqing

Рік:

2007

Мова:

english

Файл:

PDF, 167 KB

english, 2007

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Automated trace signals selection using the RTL descriptions

Yang, Yu-Shen, Veneris, Andreas, Nicolici, Nicola

Рік:

2010

Мова:

english

Файл:

PDF, 1.04 MB

english, 2010

Automating Data Analysis and Acquisition Setup in a Silicon Debug Environment

Журнал:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Рік:

2012

Мова:

english

Файл:

PDF, 750 KB

english, 2012

[IEEE 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2013.11.18-2013.11.21)] 2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - FPGA acceleration of enhanced boolean constraint propagation for SAT solvers

Thong, Jason, Nicolici, Nicola

Рік:

2013

Мова:

english

Файл:

PDF, 572 KB

english, 2013

[IEEE 2012 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2012.11.5-2012.11.8)] 2012 IEEE International Test Conference - In-system constrained-random stimuli generation for post-silicon validation

Kinsman, Adam B., Ko, Ho Fai, Nicolici, Nicola

Рік:

2012

Мова:

english

Файл:

PDF, 668 KB

english, 2012

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Automated Trace Signals Identification and State Restoration for Improving Observability in Post-Silicon Validation

Рік:

2008

Мова:

english

Файл:

PDF, 336 KB

english, 2008

[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - On Automated Trigger Event Generation in Post-Silicon Validation

Kinsman, Adam B., Nicolici, Nicola

Рік:

2008

Мова:

english

Файл:

PDF, 230 KB

english, 2008

[IEEE 2008 1st Microsystems and Nanoelectronics Research Conference (MNRC 2008) - Ottawa, ON, Canada (2008.10.15-2008.10.15)] 2008 1st Microsystems and Nanoelectronics Research Conference - An energy-efficient architecture for MPEG-2 audio/video decoding

Рік:

2008

Мова:

english

Файл:

PDF, 546 KB

english, 2008

[IEEE 2012 17th Asia and South Pacific Design Automation Conference (ASP-DAC) - Sydney, Australia (2012.01.30-2012.02.2)] 17th Asia and South Pacific Design Automation Conference - Automated data analysis techniques for a modern silicon debug environment

Yang, Yu-Shen, Veneris, Andreas, Nicolici, Nicola, Fujita, Masahiro

Рік:

2012

Мова:

english

Файл:

PDF, 140 KB

english, 2012

[IEEE 2010 11th Latin American Test Workshop - LATW - Punta del Este, Uruguay (2010.03.28-2010.03.31)] 2010 11th Latin American Test Workshop - On improving real-time observability for in-system post-silicon debug

Nicolici, Nicola

Рік:

2010

Мова:

english

Файл:

PDF, 49 KB

english, 2010

A Multiple-FPGA parallel computing architecture for real-time simulation of soft-object deformation

Mahdavikhah, Behzad, Mafi, Ramin, Sirouspour, Shahin, Nicolici, Nicola

Журнал:

ACM Transactions on Embedded Computing Systems

Рік:

2014

Мова:

english

Файл:

PDF, 3.91 MB

english, 2014

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Embedded Deterministic Test Exploiting Care Bit Clustering and Seed Borrowing

Kinsman, Adam B., Nicolici, Nicola

Рік:

2008

Мова:

english

Файл:

PDF, 459 KB

english, 2008

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test

Thong, Jason, Nicolici, Nicola

Рік:

2008

Мова:

english

Файл:

PDF, 285 KB

english, 2008

[IEEE 2010 IEEE International Conference on Computer Design (ICCD 2010) - Amsterdam, Netherlands (2010.10.3-2010.10.6)] 2010 IEEE International Conference on Computer Design - Combined optimal and heuristic approaches for multiple constant multiplication

Рік:

2010

Мова:

english

Файл:

PDF, 633 KB

english, 2010

[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Automated silicon debug data analysis techniques for a hardware data acquisition environment

Yang, Yu-Shen, Keng, Brian, Nicolici, Nicola, Veneris, Andreas, Safarpour, Sean

Рік:

2010

Мова:

english

Файл:

PDF, 5.35 MB

english, 2010

[IEEE 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Huntington Beach, CA, USA (2012.11.9-2012.11.10)] 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - On-chip stimuli generation for post-silicon validation

Nicolici, Nicola

Рік:

2012

Мова:

english

Файл:

PDF, 270 KB

english, 2012

[IEEE 2006 International Conference on Computer Design - San Jose, CA, USA (2007.10.1-2007.10.4)] 2006 International Conference on Computer Design - RTL Scan Design for Skewed-Load At-Speed Test under Power Constraints